Investigation of electrical properties of Mn doped tin oxide nanoparticles using impedance spectroscopy

Journal of Applied Physics

Volumn 108, Issue 9, 2010, Pages

  Azam, Ameer ^a   Ahmed, Arham S ^a   Chaman, M ^a   Naqvi, A H ^a  

^a ALIGARH MUSLIM UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; COMPLEX IMPEDANCE ANALYSIS; COMPOSITIONAL ANALYSIS; DIELECTRIC CONSTANTS; DIELECTRIC PARAMETERS; DOPANT CONCENTRATIONS; DOPED SAMPLE; DOPING CONCENTRATION; ELECTRICAL PROPERTY; FUNCTION OF FREQUENCY; GRAIN BOUNDARY RESISTANCE; HIGH FREQUENCY; IMPEDANCE SPECTROSCOPY; INTERFACIAL MODELS; MANGANESE CONTENT; MATRIX; MN CONTENT; MN-DOPED; MN-DOPED SNO; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPES; SEM; SINGLE PHASE; SOL-GEL METHODS; TETRAGONAL STRUCTURE; TIN OXIDE NANOPARTICLES; XRD; XRD ANALYSIS;

CRYSTALLITE SIZE; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MANGANESE; MANGANESE OXIDE; NANOPARTICLES; OXIDE MINERALS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; TIN; TIN OXIDES; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 78649247504     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3506691     Document Type: Article

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