Finite element analyses of thin film active grazing incidence X-ray optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7803, Issue , 2010, Pages

  Davis, William N ^a   Reid, Paul B ^a   Schwartz, Daniel A ^a  

^a HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

adjustable optics; finite element analysis; piezo electric; thin films; x ray optics

Indexed keywords

ADJUSTABLE OPTICS; ANGULAR RESOLUTION; CHANDRA; CHANDRA X-RAY OBSERVATORY; CORRECTION ALGORITHMS; FINITE ELEMENT ANALYSIS; GRAZING INCIDENCE; IN-SITU; INFLUENCE FUNCTIONS; MIRROR MOUNTING; MISSION CONCEPTS; ON-ORBIT; PIEZO-ELECTRIC; SUB-ARC; THIN GLASS; X RAY TELESCOPE; X-RAY ASTRONOMY; X-RAY SKY; X-RAY WINDOW;

ASTRONOMY; FINITE ELEMENT METHOD; MIRRORS; OPTICAL TELESCOPES; PIEZOELECTRICITY; THIN FILMS; VAPOR DEPOSITION; X RAY OPTICS; X RAYS;

X RAY ANALYSIS;

EID: 78549272656     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.862522     Document Type: Conference Paper

References (4)

1. SDRC I-DEAS, Now Siemens PLM Software, 5800 Granite Parkway Suite 600, Plano, TX 75024
2. SigFit Program, Sigmadyne, Inc. 803 West Avenue, Rochester, NY 14611 www.sigmadyne.com
3. Reid, P., et al., "Generation-X mirror technology development plan and the development of adjustable x-ray optics" SPIE Proc 7437, 44 (2009).
4. Wilke, R. H. T., Trolier-McKinstry, S., Reid, P. B., and Schwartz, D. A., "PZT Piezoelectric Films on Glass for Gen-X Imaging Systems" to be published, this SPIE proceedings.