Clustering elliptical anomalies in sensor networks

2010 IEEE World Congress on Computational Intelligence, WCCI 2010

Volumn , Issue , 2010, Pages

  Bezdek, James C ^a   Havens, Timothy C ^a   Keller, James M ^a   Leckie, Chris ^a   Park, Laurence ^a   Palaniswami, Marimuthu ^a   Rajasegarar, Sutharshan ^a  

^a NONE

Author keywords

Anomaly detection; Elliptical similarity; Visual assessment of clustering tendency; Wireless sensor networks

Indexed keywords

ANOMALY DETECTION; ELLIPTICAL SIMILARITY; HIGHER ORDER; LEVEL SET; VISUAL ASSESSMENTS; VISUAL INSPECTION; WIRELESS SENSOR;

ARTIFICIAL INTELLIGENCE; SENSOR NETWORKS; SENSOR NODES;

WIRELESS SENSOR NETWORKS;

EID: 78549267848     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FUZZY.2010.5584464     Document Type: Conference Paper

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