Loss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection method

Optics Letters

Volumn 35, Issue 22, 2010, Pages 3814-3816

  Gaylord, Thomas K ^a   Lin, Chien I ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR SPECTRA; ATTENUATED TOTAL REFLECTION METHODS; ATTENUATED TOTAL REFLECTIONS; LOSS MEASUREMENT; MIM STRUCTURE; PLANAR METAL; PLASMONIC; PROPAGATION LENGTHS; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SURFACE PLASMON MODES; THEORETICAL PREDICTION; WAVEGUIDE STRUCTURE;

ELECTROMAGNETIC WAVE REFLECTION; METAL INSULATOR BOUNDARIES; METALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; PLASMONS; SEMICONDUCTOR INSULATOR BOUNDARIES; SILICON COMPOUNDS; SPECTRUM ANALYSIS; WAVEGUIDES;

MIM DEVICES;

EID: 78549247466     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.003814     Document Type: Article

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