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Volumn 3, Issue 10, 2010, Pages
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Femtosecond snapshot holography with extended reference using extreme ultraviolet free-electron laser
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Author keywords
[No Author keywords available]
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Indexed keywords
APERTURE SIZES;
DIFFERENTIAL OPERATION;
EXTREME ULTRAVIOLET;
FEMTOSECONDS;
HIGH SPATIAL RESOLUTION;
HOLOGRAPHIC TECHNIQUE;
PHASE-CONTRAST;
PHASE-CONTRAST IMAGING;
PICOSECONDS;
SHORT WAVELENGTHS;
SINGLE-SHOT;
SPATIAL RESOLUTION;
TEST PATTERN;
TRANSIENT PHENOMENON;
ULTRA-FAST;
FREE ELECTRON LASERS;
HOLOGRAMS;
IMAGE RESOLUTION;
LASER RECORDING;
ULTRAVIOLET LASERS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
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EID: 78549236129
PISSN: 18820778
EISSN: 18820786
Source Type: Journal
DOI: 10.1143/APEX.3.102701 Document Type: Article |
Times cited : (7)
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References (17)
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