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Volumn 59, Issue 2, 2011, Pages 429-439
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On the role of non-basal deformation mechanisms for the ductility of Mg and Mg-Y alloys
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a
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Author keywords
Dislocations; Electron backscattering diffraction (EBSD); Shear bands; Transmission electron microscopy (TEM); Twinning
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Indexed keywords
BASAL SLIP;
BASAL TEXTURES;
DEFORMATION MECHANISM;
DEFORMATION MODES;
DISLOCATIONS;
DUCTILITY IMPROVEMENT;
ELECTRON BACK SCATTER DIFFRACTION;
ELECTRON BACKSCATTERING DIFFRACTION (EBSD);
ENHANCED DUCTILITY;
HIGH ACTIVITY;
HIGH-ACTIVATION;
HOMOGENEOUS DEFORMATION;
MICROSTRUCTURE ANALYSIS;
NON-BASAL;
PURE MG;
ROOM-TEMPERATURE DUCTILITY;
TEXTURE ANALYSIS;
TRANSMISSION ELECTRON;
WORK HARDENING;
WROUGHT ALLOYS;
ALLOYS;
BACKSCATTERING;
CERIUM ALLOYS;
DEFORMATION;
DIFFRACTION;
DUCTILITY;
ELECTRON SCATTERING;
ELECTRONS;
SHEAR BANDS;
STRAIN HARDENING;
TEXTURES;
TRACE ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 78449240706
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.08.031 Document Type: Article |
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Times cited : (794)
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References (29)
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