Time-resolved spatially offset Raman spectroscopy for depth analysis of diffusely scattering layers

Analyst

Volumn 135, Issue 12, 2010, Pages 3255-3259

  Iping Petterson, Ingeborg E ^a   Dvoák, Patrick ^a   Buijs, Joost B ^a   Gooijer, Cees ^a   Ariese, Freek ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78349266123     PISSN: 00032654     EISSN: 13645528     Source Type: Journal    
DOI: 10.1039/c0an00611d     Document Type: Conference Paper

References (20)

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