On label information incorporated metric learning for regressions

International Journal of Computational Intelligence and Applications

Volumn 9, Issue 4, 2010, Pages 339-351

  Jin, Cheng ^a   Long, Yangjing ^b  

^a China Mobile Group Zhejiang Co Ltd   (China)

^b MAX PLANCK INSTITUTE FOR MATHEMATICS IN THE SCIENCES   (Germany)

Author keywords

application; label information; Metric learning; regression

Indexed keywords

DISTANCE METRIC LEARNING; DISTANCE METRICS; GAUSSIAN PROCESS REGRESSION; HEAD POSE; LABEL INFORMATION; LINEAR TRANSFORMATION; MANIFOLD LEARNING ALGORITHM; METRIC LEARNING; OPTIMIZATION METHOD; OPTIMIZATION PROBLEMS; REGRESSION; REGRESSION MODEL; REGRESSION PROBLEM; TEST SAMPLES;

LINEAR TRANSFORMATIONS; METADATA; OPTIMIZATION; REGRESSION ANALYSIS;

LEARNING ALGORITHMS;

EID: 78349262271     PISSN: 14690268     EISSN: None     Source Type: Journal    
DOI: 10.1142/S1469026810002938     Document Type: Article

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