Structure, topology and chemical order in Ge-As-Te glasses: A high-energy x-ray diffraction study

Journal of Physics Condensed Matter

Volumn 22, Issue 40, 2010, Pages

  Sen, S ^a   SoyerUzun, S ^a   Benmore, C J ^b   Aitken, B G ^c  

^a University of California   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Corning Incorporated ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; CHEMICAL ORDER; COMPOSITIONAL EVOLUTION; COORDINATION ENVIRONMENT; FIRST SHARP DIFFRACTION PEAK; GLASS TRANSITION TEMPERATURE; HIGH ENERGY X-RAY DIFFRACTION; MOLAR VOLUMES; NEAREST-NEIGHBORS; SELENIDES; STRUCTURAL PARAMETER; TELLURIDE GLASS;

DIFFRACTION; GERMANIUM; GLASS TRANSITION; HIGH ENERGY PHYSICS; SOLID ELECTROLYTES; TELLURIUM COMPOUNDS; X RAY DIFFRACTION;

GLASS;

ARSENIC; GERMANIUM; GLASS; TELLURIUM;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; X RAY DIFFRACTION;

ARSENIC; GERMANIUM; GLASS; MODELS, CHEMICAL; TELLURIUM; X-RAY DIFFRACTION;

EID: 78349261505     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/40/405401     Document Type: Article

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