The importance of choosing the right validation strategy in inverse modelling

Journal of Near Infrared Spectroscopy

Volumn 18, Issue 4, 2010, Pages 231-237

  Kemps, Bart J ^a   Saeys, Wouter ^a   Mertens, Kristof ^a   Darius, Paul ^a   De Baerdemaeker, Josse G ^a   De Ketelaere, Bart ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Inverse modelling; Measurement day; Process analytical technology; Reliability; Validation

Indexed keywords

EID: 78249274221     PISSN: 09670335     EISSN: None     Source Type: Journal    
DOI: 10.1255/jnirs.882     Document Type: Article

References (9)

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