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Volumn , Issue , 2002, Pages 749-756
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Theory and simulation of a novel viscosity measurement method for high temperature semiconductor melt
a a a a b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
FLOW OF FLUIDS;
MAGNETIC FIELDS;
MECHANICAL ENGINEERING;
QUARTZ;
ROTATION;
VISCOMETERS;
VISCOSITY;
VISCOSITY MEASUREMENT;
ANGULAR DEFLECTION;
ELECTRICAL CONDUCTIVITY;
EXPERIMENTAL DATA;
FLUID FLOW;
HIGH TEMPERATURE;
MELT FLOW;
NOVEL METHODS;
NUMERICAL FITTING;
QUARTZ AMPOULE;
ROTATING MAGNETIC FIELDS;
SEMICONDUCTOR MELTS;
STEADY STATE;
THEORETICAL BASIS;
TORSIONAL OSCILLATION;
TRANSIENT VELOCITY;
OSCILLATING FLOW;
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EID: 78249265340
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/IMECE2002-32352 Document Type: Conference Paper |
Times cited : (5)
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References (9)
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