메뉴 건너뛰기




Volumn , Issue , 2002, Pages 99-104

Cyclic mechanical durability of Sn-3.9Ag-0.6Cu and Sn-3.5Ag lead-free solder alloys

Author keywords

Cyclic mechanical durability; Energy partitioning; Lead free solder; Thermal cycling test

Indexed keywords

ALLOYS; CERIUM ALLOYS; COPPER ALLOYS; DURABILITY; EUTECTICS; MECHANICAL ENGINEERING; SILVER; SILVER ALLOYS; STRAIN RATE; TESTING; THERMAL CYCLING; TIN; TIN ALLOYS;

EID: 78249240914     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2002-39250     Document Type: Conference Paper
Times cited : (6)

References (14)
  • 2
    • 85013292283 scopus 로고
    • Solder Creep-Fatigue Analysis by an Energy-Partitioning Approach
    • Dasgupta, A., Oyan, C., Barker, D., and Pecht, M., 1991, "Solder Creep-Fatigue Analysis by an Energy-Partitioning Approach," ASME Journal of Electronic Packaging, Vol. 114, No. 2, pp. 152-160.
    • (1991) ASME Journal of Electronic Packaging , vol.114 , Issue.2 , pp. 152-160
    • Dasgupta, A.1    Oyan, C.2    Barker, D.3    Pecht, M.4
  • 3
    • 0035359909 scopus 로고    scopus 로고
    • High Temperature Lead-free Solder for Microelectronics
    • Gayle F., et. al., 2001, "High Temperature Lead-free Solder for Microelectronics," Journal of Materials, Vol. 53, No. 6, pp.17-21
    • (2001) Journal of Materials , vol.53 , Issue.6 , pp. 17-21
    • Gayle, F.1
  • 6
    • 34249863497 scopus 로고    scopus 로고
    • Durability Properties Characterization of Sn62Pb36Ag2 Solder Alloy
    • Orlando, FL
    • Haswell, P. and Dasgupta, A., 2000, "Durability Properties Characterization of Sn62Pb36Ag2 Solder Alloy," Proceedings ASME IMECE, EEP-Vol. 28, pp. 181-187, Orlando, FL.
    • (2000) Proceedings ASME IMECE, EEP , vol.28 , pp. 181-187
    • Haswell, P.1    Dasgupta, A.2
  • 7
    • 0346235866 scopus 로고    scopus 로고
    • Viscoplastic Constitutive Properties of Lead-Free Sn-3.9Ag-0.6Cu Alloy
    • Haswell, P. and Dasgupta, A., 2001, "Viscoplastic Constitutive Properties of Lead-Free Sn-3.9Ag-0.6Cu Alloy," MRS Proceedings, San Francisco, CA.
    • (2001) MRS Proceedings, San Francisco, CA
    • Haswell, P.1    Dasgupta, A.2
  • 8
    • 33646642326 scopus 로고    scopus 로고
    • National Electronics Manufacturing Initiative (NEMI), 2001, Lead Free Interconnects Project, www.nemi.org.
    • (2001) Lead Free Interconnects Project
  • 9
    • 0038707886 scopus 로고    scopus 로고
    • Lead-free Flip-Chip Solder Interconnects - Materials Mechanics and Reliability Issues
    • Schubert A., et. al., 2002a, "Lead-free Flip-Chip Solder Interconnects - Materials Mechanics and Reliability Issues," Micromaterials and Nanomaterials, issue 1, pp.12-24.
    • (2002) Micromaterials and Nanomaterials , Issue.1 , pp. 12-24
    • Schubert, A.1
  • 12
    • 33846617849 scopus 로고    scopus 로고
    • Reliability of Lead-Free Solder Connections for Area-Array Packages
    • Syed A., 2001, "Reliability of Lead-Free Solder Connections for Area-Array Packages," IPC SMEMA Council APEX 2001.
    • (2001) IPC SMEMA Council APEX 2001
    • Syed, A.1
  • 14
    • 0038369494 scopus 로고    scopus 로고
    • Reliability and Leachate Testing of Lead-Free Solder Joints
    • San Jose, CA
    • Woodrow T., "Reliability and Leachate Testing of Lead-Free Solder Joints," IPC-JEDEC 2002, pp.116-125, San Jose, CA.
    • (2002) IPC-JEDEC , pp. 116-125
    • Woodrow, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.