Analysis of power switching losses accounting probe modeling

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 12, 2010, Pages 3218-3226

  Ammous, Kaiar ^a   Morel, Hervé ^b   Ammous, Anis ^a  

^a UNIVERSITY OF SFAX   (Tunisia)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

Distortions; losses; measurement; power; probe modeling

Indexed keywords

DISTORTIONS; FAST TRANSIENTS; POWER; POWER SEMICONDUCTOR DEVICES; POWER SWITCHING; PROBE-MODEL; SIMULATION AND MEASUREMENT; WAVE FORMS;

COMPUTER SIMULATION; ERRORS; POWER ELECTRONICS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICES;

PROBES;

EID: 78149469470     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2010.2047302     Document Type: Article

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