A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction

Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

  Kassier, G H ^a   Haupt, K ^a   Erasmus, N ^a   Rohwer, E G ^a   Von Bergmann, H M ^a   Schwoerer, H ^a   Coelho, S M M ^b   Auret, F D ^b  

^a STELLENBOSCH UNIVERSITY   (South Africa)

^b UNIVERSITY OF PRETORIA   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATION MODES; BRIGHT PULSE; ELECTRON ENERGIES; FEMTO-SECOND ELECTRON BUNCH; PARTICLE TRAJECTORIES; TEMPORAL RESOLUTION; TIME RESOLVED MEASUREMENT; ULTRA-FAST; ULTRAFAST ELECTRON DIFFRACTION;

CAMERAS; ELECTRON DIFFRACTION; STREAK CAMERAS; STRUCTURAL DYNAMICS; TIMING JITTER;

ELECTRONS;

EID: 78149452584     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3489118     Document Type: Conference Paper

References (17)

1. B. J. Siwick and R. J. D. Miller, Chem. Phys. CMPHC2 0301-0104 299, 285 (2004). 10.1016/j.chemphys.2003.11.040
2. J. R. Dwyer, C. T. Hebeisen, R. Ernstorfer, M. Harb, V. B. Deyirmenjian, R. E. Jordan, and R. J. D. Miller, Philos. Trans. R. Soc. London, Ser. A PTRMAD 0962-8428 364, 741 (2006). 10.1098/rsta.2005.1735
3. H. Ihee, V. A. Lobastov, U. M. Gomez, B. M. Goodson, R. Srinivasan, C. -Y. Ruan, and A. H. Zewail, Science SCIEAS 0036-8075 291, 458 (2001). 10.1126/science.291.5503.458
4. T. van Oudheusden, E. F. de Jong, S. van der Geer, W. P. E. M. Op 't Root, and O. J. Luiten, J. Appl. Phys. JAPIAU 0021-8979 102, 093501 (2007). 10.1063/1.2801027
5. G. H. Kassier, K. Haupt, N. Erasmus, E. G. Rohwer, and H. Schwoerer, J. Appl. Phys. JAPIAU 0021-8979 105, 113111 (2009). 10.1063/1.3132834
6. B. J. Siwick, J. R. Dwyer, R. E. Jordan, and R. J. D. Miller, J. Appl. Phys. JAPIAU 0021-8979 92, 1643 (2002). 10.1063/1.1487437
7. X. Wang, S. Nie, H. Park, J. Li, R. Clinite, R. Li, X. Wang, and J. Cao, Rev. Sci. Instrum. RSINAK 0034-6748 80, 013902 (2009). 10.1063/1.3062863
8. C. T. Hebeisen, G. Sciaini, M. Harb, R. Ernstorfer, T. Dartigalongue, S. G. Kruglik, and R. J. D. Miller, Opt. Express OPEXFF 1094-4087 16, 3334 (2008). 10.1364/OE.16.003334
9. J. Liu, J. Wang, B. Shan, C. Wang, and Z. Chang, Appl. Phys. Lett. APPLAB 0003-6951 82, 3553 (2003). 10.1063/1.1577213
10. p-1.
11. θ decreases with decreasing aperture size.
12. C. Belzile, J. C. Kieffer, C. Y. Cote, T. Oksenhendler, and D. Kaplan, Rev. Sci. Instrum. RSINAK 0034-6748 73, 1617 (2002). 10.1063/1.1445824
13. C. Bont́, M. Harmand, F. Dorchies, S. Magnan, V. Pitre, J. C. Kieffer, P. Audebert, and J. P. Geindre, Rev. Sci. Instrum. RSINAK 0034-6748 78, 043503 (2007). 10.1063/1.2720718
14. This corresponds to an electric field ramp rate of 10 kV/mm/ns.
15. V. Y. Arsenin and A. N. Tikhonov, Solutions of Ill-Posed Problems (John Wiley & Sons, New York, 1977).
16. G. Landi and F. Zama, Appl. Math. Comput. AMHCBQ 0096-3003 175, 715 (2006). 10.1016/j.amc.2005.07.037
17. See www.desy.de/~mpyflo/.