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Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry

(3) Happel, T a Blanco, E a Estrada, T a

a LABORATORIO NACIONAL DE FUSIÓN (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERED SIGNAL; CUT-OFF LAYERS; DOPPLER; DOPPLER REFLECTOMETER; DOPPLER REFLECTOMETRY; FULL-WAVE SIMULATIONS; MICROWAVE BEAM; RADIUS OF CURVATURE; SIGNAL QUALITY; VELOCITY SHEAR LAYERS;

PLASMA SIMULATION; REFLECTOMETERS; SPECTRAL RESOLUTION; VELOCITY;

SHEAR FLOW;

EID: 78149433435 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3464475 Document Type: Conference Paper

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.