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Volumn 81, Issue 10, 2010, Pages

2D electron cyclotron emission imaging at ASDEX Upgrade

(14) Classen, I G J a,b Boom, J E b Suttrop, W a Schmid, E a Tobias, B c Domier, C W c Luhmann Jr , N C c Donn A J H b,d Jaspers, R J E d De Vries, P C b Park, H K e Munsat, T f Garcia Muoz M a Schneider, P A a

a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK (Germany)

b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN (Netherlands)

c UNIVERSITY OF CALIFORNIA (United States)

d EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

e Pohang University of Science and Technology (POSTECH) (South Korea)

f UNIVERSITY OF COLORADO (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASDEX UPGRADE; D ELECTRONS; EDGE LOCALIZED MODES; EIGEN MODES; ELECTRON CYCLOTRON EMISSION IMAGING; ELECTRON CYCLOTRON EMISSION MEASUREMENTS; REVERSED SHEAR; TEMPORAL RESOLUTION;

CYCLOTRONS; ELECTRON CYCLOTRON RESONANCE; ELECTRON TEMPERATURE; SECURITY OF DATA; SINGULAR VALUE DECOMPOSITION;

ELECTRON EMISSION;

EID: 78149428244 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3483214 Document Type: Conference Paper

Times cited : (102)

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