193 nm ArF excimer laser and the potential risk for cataract formation

Journal of Applied Sciences Research

Volumn 6, Issue 7, 2010, Pages 796-805

  Abdelkawi, S A ^a   Ghoneim, D F ^b   Atoat, W ^a   Badr, Y A ^b  

^a RESEARCH INSTITUTE OF OPHTHALMOLOGY   (Egypt)

^b Cairo University   (Egypt)

Author keywords

Electrophoresis; Excimer laser; Gel chromatography; Lens protein; Refractive index; UV spectroscopy

Indexed keywords

EID: 78149419882     PISSN: 1816157X     EISSN: 1819544X     Source Type: Journal    
DOI: None     Document Type: Article

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