Thickness and refractive index measurements by full-field optical coherence microscopy

IEEE Sensors Journal

Volumn 9, Issue 12, 2009, Pages 1996-1997

  Na, Jihoon ^a   Choi, Woo June ^a   Choi, Hae Young ^a   Ryu, Seon Young ^a   Choi, Eun Seo ^b   Lee, Byeong Ha ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b Chosun University   (South Korea)

Author keywords

Full field optical coherence microscopy (FF OCM); Medical imaging equipment; Refractive index measurement

Indexed keywords

CROSS SECTIONAL IMAGE; FACE IMAGES; FLAT GLASS; FULL-FIELD; HIGH-RESOLUTION DEPTH; MEDICAL IMAGING EQUIPMENT; OPTICAL COHERENCE MICROSCOPY; PHYSICAL THICKNESS; REFERENCE PLANE; REFRACTIVE INDEX MEASUREMENT; REFRACTIVE-INDEX DISTRIBUTION;

LIGHT REFRACTION; REFRACTIVE INDEX; REFRACTOMETERS;

MEDICAL IMAGING;

EID: 78149403240     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2009.2031808     Document Type: Article

References (8)

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8. [Online]. Available: http://www.sscpcorp.com