First principles derivation of microcavity semiconductor laser threshold condition and its application to FDTD active cavity modeling

Journal of the Optical Society of America B: Optical Physics

Volumn 27, Issue 11, 2010, Pages 2262-2272

  Mock, Adam ^a  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; LASERS; MAXWELL EQUATIONS; MICROCAVITIES;

ACTIVE CAVITY; FINITE DIFFERENCE TIME DOMAINS; FIRST-PRINCIPLES DERIVATIONS; LASER THRESHOLD; MAXWELL'S EQUATIONS; OPTICAL CONFINEMENT FACTORS; QUALITY FACTORS; SEMICONDUCTOR MICROCAVITIES; THRESHOLD CONDITION;

SEMICONDUCTOR LASERS;

EID: 78149363770     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.27.002262     Document Type: Article

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