Mining mutually dependent patterns

Proceedings - IEEE International Conference on Data Mining, ICDM

Volumn , Issue , 2001, Pages 409-416

  Ma, Sheng ^a   Hellerstein, Joseph L ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78149340570     PISSN: 15504786     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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