Kaolinite platelet orientation for XRD and AFM applications

Applied Clay Science

Volumn 50, Issue 3, 2010, Pages 299-304

  Zbik, Marek S ^a   Raftery, Noel A ^a   Smart, Roger St C ^b   Frost, Ray L ^a  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^b UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

AFM; Kaolinite; Particle orientation; Thin films; XRD

Indexed keywords

AFM; AGGREGATE STRUCTURES; BASAL PLANES; CLAY AGGREGATES; CLAY PARTICLES; CLAY PLATELETS; CLAY SUSPENSIONS; CONDUCTING AFM; DRIED FILMS; DRY MASS; INTENSITY RATIO; OPTIMAL ORIENTATION; PARTICLE CONCENTRATIONS; PARTICLE DIAMETERS; PARTICLE ORIENTATION; RANDOM ORIENTATIONS; SEM; SEM MICROGRAPHS; THIN LAYERS; XRD;

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; KAOLINITE; PLATELETS; SCANNING ELECTRON MICROSCOPY; SILICATE MINERALS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SUSPENSIONS (FLUIDS);

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; KAOLINITE; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

EID: 78149284464     PISSN: 01691317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.clay.2010.08.010     Document Type: Article

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