Effects of annealing temperature, atomic composition, film thickness on structure and magnetic properties of CoPt composite films

Journal of Alloys and Compounds

Volumn 509, Issue 2, 2011, Pages 326-331

  Zhang, Y J ^a   Yang, Y T ^a   Liu, Y ^a   Wang, Y X ^a   Li, X Y ^a   Wang, D D ^b   Cao, J ^b   Yang, N N ^a   Li, J ^a   Yang, S Y ^a   Liu, Y Q ^a   Wei, M B ^a   Yang, J H ^a  

^a JILIN NORMAL UNIVERSITY   (China)

^b CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

L10 phase; Magnetization reversal mechanism; Phase transformation

Indexed keywords

ANNEALING TEMPERATURES; ATOMIC COMPOSITIONS; COERCIVITIES; COSPUTTERING; FACE CENTERED CUBIC STRUCTURE; INTRINSIC STRESS; L10 PHASE; MAGNETIZATION REVERSAL MECHANISM; MAGNETIZATION REVERSAL MECHANISMS; MAGNETRON SPUTTERING SYSTEMS; ORDERED STRUCTURES; PHASE TRANSFORMATION; POST DEPOSITION ANNEALING; W MODEL;

ANNEALING; COBALT; COERCIVE FORCE; COMPOSITE FILMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC DEVICES; PLATINUM; X RAY DIFFRACTION;

MAGNETIZATION REVERSAL;

EID: 78149281091     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.09.020     Document Type: Article

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