How to measure the optical thickness of scattering particles from the phase delay of scattered waves: Application to turbid samples

Physical Review Letters

Volumn 105, Issue 19, 2010, Pages

  Potenza, M A C ^a   Sabareesh, K P V ^a   Carpineti, M ^a   Alaimo, M D ^a   Giglio, M ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION FREE; OPTICAL THEOREM; OPTICAL THICKNESS; PHASE DELAY; QUANTITATIVE VERIFICATION; SCATTERED WAVES; SCATTERING PARTICLES; SOFT MATTER; TRANSMITTED BEAM INTENSITY DISTRIBUTION; TWO-DIMENSIONAL POWER SPECTRUM; ZERO ANGLE;

LIGHT POLARIZATION;

SCATTERING;

EID: 78149248654     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.193901     Document Type: Article

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