Cold-neutron depth profiling as a research tool for the study of surface oxides on metals

Canadian Journal of Physics

Volumn 88, Issue 10, 2010, Pages 751-758

  Tun, Z ^a   Noel J J ^b   Bohdanowicz, Th ^c   Cao, L R ^d   Downing, R G ^e   Goncharova, L V ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

^c UNIVERSITY OF WATERLOO   (Canada)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE OXYGEN; DATA COLLECTION RATES; ENERGY RESOLUTIONS; PASSIVE OXIDES; RESEARCH TOOLS; SURFACE OXIDE;

BORON; BORON COMPOUNDS; IONIZATION OF GASES; ISOTOPES; OXYGEN;

DEPTH PROFILING;

EID: 78149246009     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P10-062     Document Type: Article

References (6)

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