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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 23, 2010, Pages 3478-3481

Total reflection X-ray fluorescence analysis using polycapillaries. A comparison with conventional setups

(4) Sánchez, Héctor Jorge a Perez, Roberto Daniel a Carvalho, Maria Luisa b Rubio, Marcelo a

a UNIVERSIDAD NACIONAL DE CÓRDOBA (Argentina)

b UNIVERSITY OF LISBON (Portugal)

Author keywords

Polycapillary; Trace analysis; TXRF

Indexed keywords

DETECTION LIMITS; LIGHT ELEMENTS; LOW BACKGROUND; LOW DIVERGENCE; POLYCAPILLARIES; SIGNAL-NOISE RATIO; TOTAL REFLECTION X-RAY FLUORESCENCE; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; TXRF; X RAY BEAM;

CHEMICAL ELEMENTS; ELECTROMAGNETIC WAVE REFLECTION; EXPERIMENTS; FLUORESCENCE; X RAY ANALYSIS; X RAYS;

TRACE ANALYSIS;

EID: 78149242681 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2010.09.019 Document Type: Article

Times cited : (3)

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