-
1
-
-
0003708260
-
-
JEOL Akishima
-
T. Sekine, Y. Nagasawa, M. Kudoh, Y. Sakai, A.S. Parkes, J.D. Geller, A. Mogami, and K. Hirata Handbook of Auger Electron Spectroscopy 1982 JEOL Akishima
-
(1982)
Handbook of Auger Electron Spectroscopy
-
-
Sekine, T.1
Nagasawa, Y.2
Kudoh, M.3
Sakai, Y.4
Parkes, A.S.5
Geller, J.D.6
Mogami, A.7
Hirata, K.8
-
2
-
-
0003909387
-
-
JEOL Akishima
-
N. Ikeo, Y. Iijima, N. Niimura, M. Sigematsu, T. Tazawa, S. Matsumoto, K. Kojima, and Y. Nagasawa Handbook of X-ray Photoelectron Spectroscopy 1991 JEOL Akishima
-
(1991)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Ikeo, N.1
Iijima, Y.2
Niimura, N.3
Sigematsu, M.4
Tazawa, T.5
Matsumoto, S.6
Kojima, K.7
Nagasawa, Y.8
-
4
-
-
0003420793
-
-
3rd ed. Physical Electronics Eden Prairie
-
K.D. Childs, B.A. Carlson, L.A. LaVanier, J.F. Moulder, D.F. Paul, W.F. Stickle, and D.G. Watson Handbook of Auger Electron Spectroscopy 3rd ed. 1995 Physical Electronics Eden Prairie
-
(1995)
Handbook of Auger Electron Spectroscopy
-
-
Childs, K.D.1
Carlson, B.A.2
Lavanier, L.A.3
Moulder, J.F.4
Paul, D.F.5
Stickle, W.F.6
Watson, D.G.7
-
5
-
-
78049456178
-
-
Certain commercial instruments and products are identified in this paper to specify the sources of data analyzed here and the experimental conditions used to acquire the data. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the data sources and instruments identified are necessarily the best available for the purpose
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Certain commercial instruments and products are identified in this paper to specify the sources of data analyzed here and the experimental conditions used to acquire the data. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the data sources and instruments identified are necessarily the best available for the purpose.
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-
-
-
6
-
-
78049474433
-
-
ISO 17974: 2002, Surface Chemical Analysis - High-resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis and Chemical-state analysis, International Organization for Standardization, Geneva, 2002
-
ISO 17974: 2002, Surface Chemical Analysis - High-resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis and Chemical-state analysis, International Organization for Standardization, Geneva, 2002.
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-
-
-
8
-
-
78049459727
-
-
ISO 15472: 2001, Surface Chemical Analysis - X-ray Photoelectron Spectrometers - Calibration of energy scales, International Organization for Standardization, Geneva, 2001
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ISO 15472: 2001, Surface Chemical Analysis - X-ray Photoelectron Spectrometers - Calibration of energy scales, International Organization for Standardization, Geneva, 2001.
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-
-
-
10
-
-
78049482064
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-ray Photoelectron Spectrometer
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ASTM E2108-05
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ASTM E2108-05, Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-ray Photoelectron Spectrometer, 2008 Annual Book of ASTM Standards, ASTM International, West Conshohocken, 2008, vol. 3.06, p. 786.
-
(2008)
2008 Annual Book of ASTM Standards, ASTM International, West Conshohocken
, vol.3
, Issue.6
, pp. 786
-
-
-
22
-
-
78049461455
-
-
private communication
-
J.S. Hammond, private communication.
-
-
-
Hammond, J.S.1
-
28
-
-
0008885368
-
-
M. Pessa, A. Vuoristo, M. Vulli, S. Aksela, J. Vayrynen, T. Rantala, and H. Aksela Phys. Rev. B 20 1979 3115
-
(1979)
Phys. Rev. B
, vol.20
, pp. 3115
-
-
Pessa, M.1
Vuoristo, A.2
Vulli, M.3
Aksela, S.4
Vayrynen, J.5
Rantala, T.6
Aksela, H.7
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