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Volumn 6255 LNCS, Issue , 2010, Pages 199-213

Scalable distributed concolic testing: A case study on a flash storage platform

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COSTS; COMPUTING NODES; CONVENTIONAL TESTING; EMPIRICAL RESULTS; FLASH FILE SYSTEMS; FLASH STORAGE; INFORMATION SOCIETY; READ OPERATION; SAMSUNG; TEST CASE; VERIFICATION FRAMEWORK;

EID: 78049430541     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-14808-8_14     Document Type: Conference Paper
Times cited : (3)

References (19)
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    • 72049114814 scopus 로고    scopus 로고
    • Technical Report UCB/EECS-2008-123, EECS Department, University of California, Berkeley September
    • Burnim, J., Sen, K.: Heuristics for scalable dynamic test generation. Technical Report UCB/EECS-2008-123, EECS Department, University of California, Berkeley (September 2008)
    • (2008) Heuristics for Scalable Dynamic Test Generation
    • Burnim, J.1    Sen, K.2
  • 5
    • 33749846787 scopus 로고    scopus 로고
    • A fast linear-arithmetic solver for DPLL(T)
    • Ball, T., Jones, R.B. (eds.) CAV 2006. Springer, Heidelberg
    • Dutertre, B., Moura, L.: A fast linear-arithmetic solver for DPLL(T). In: Ball, T., Jones, R.B. (eds.) CAV 2006. LNCS, vol. 4144, pp. 81-94. Springer, Heidelberg (2006)
    • (2006) LNCS , vol.4144 , pp. 81-94
    • Dutertre, B.1    Moura, L.2
  • 10
    • 78049416914 scopus 로고    scopus 로고
    • Formal modeling and analysis of a flash filesystem in Alloy
    • Kang, E., Jackson, D.: Formal modeling and analysis of a flash filesystem in Alloy. In: Abstract state machines, B and Z (2008)
    • (2008) Abstract State Machines, B and Z
    • Kang, E.1    Jackson, D.2
  • 11
    • 78049444885 scopus 로고    scopus 로고
    • Formal verification of a flash memory device driver - An experience report
    • Kim, M., Choi, Y., Kim, Y., Kim, H.: Formal verification of a flash memory device driver - an experience report. In: Spin Workshop (2008)
    • Spin Workshop (2008)
    • Kim, M.1    Choi, Y.2    Kim, Y.3    Kim, H.4
  • 12
    • 70649099972 scopus 로고    scopus 로고
    • Concolic testing of the multi-sector read operation for flash memory file system
    • Oliveira, M.V.M., Woodcock, J. (eds.) SBMF 2009. Springer, Heidelberg
    • Kim, M., Kim, Y.: Concolic testing of the multi-sector read operation for flash memory file system. In: Oliveira, M.V.M., Woodcock, J. (eds.) SBMF 2009. LNCS, vol. 5902, pp. 251-265. Springer, Heidelberg (2009)
    • (2009) LNCS , vol.5902 , pp. 251-265
    • Kim, M.1    Kim, Y.2
  • 13
    • 56249136955 scopus 로고    scopus 로고
    • Unit testing of flash memory device driver through a SAT-based model checker
    • September
    • Kim, M., Kim, Y., Kim, H.: Unit testing of flash memory device driver through a SAT-based model checker. In: Automated Software Engineering (ASE) (September 2008)
    • (2008) Automated Software Engineering (ASE)
    • Kim, M.1    Kim, Y.2    Kim, H.3
  • 14
    • 0016971687 scopus 로고
    • Symbolic execution and program testing
    • King, J.C.: Symbolic execution and program testing. Communications of the ACM 19(7) (1976)
    • (1976) Communications of the ACM , vol.19 , pp. 7
    • King, J.C.1
  • 15
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    • Samsung OneNAND fusion memory, http://www.samsung.com/global/ business/semiconductor/products/fusionmemory/Products-OneNAND.html
    • Samsung OneNAND Fusion Memory


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.