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Volumn 73, Issue 12, 2010, Pages 1073-1076
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A scanning electron microscopy specimen holder for viewing different angles of a single specimen
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Author keywords
Freedom of rotation; SEM; Specimen holder
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Indexed keywords
CONDUCTIVE PADS;
DOUBLE SIDED;
FREEDOM OF ROTATION;
IMAGES BACKGROUND;
NOISY SIGNALS;
SINGLE SPECIMEN;
SPECIMEN HOLDER;
SCANNING ELECTRON MICROSCOPY;
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EID: 78049413677
PISSN: 1059910X
EISSN: 10970029
Source Type: Journal
DOI: 10.1002/jemt.20835 Document Type: Article |
Times cited : (114)
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References (8)
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