Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7730, Issue , 2010, Pages

  Kim, Jaisoon ^a   Kim, Moonseok ^b   Hong, Sukjoon ^b   Milster, Tom D ^c  

^a Myong Ji University   (South Korea)

^b Seoul National University   (South Korea)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

Bessel beam; optical data storage; SIAX; SIL Axicon

Indexed keywords

BESSEL BEAM; DATA STORAGE; DEPTH OF FOCUS; HIGH DENSITY DATA STORAGE; HIGH NA; INCIDENT ANGLES; OPTICAL DATA; SIAX; SIL-AXICON;

BESSEL FUNCTIONS; FITS AND TOLERANCES; GEOMETRICAL OPTICS; LASER BEAMS; OPTICAL DATA PROCESSING; OPTICAL SYSTEMS;

OPTICAL DATA STORAGE;

EID: 78049400678     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.859234     Document Type: Conference Paper

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