Using the support vector machine as a classification method for software defect prediction with static code metrics

Communications in Computer and Information Science

Volumn 43 CCIS, Issue , 2009, Pages 223-234

  Gray, David ^a   Bowes, David ^a   Davey, Neil ^a   Sun, Yi ^a   Christianson, Bruce ^a  

^a UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED DETECTION; CLASSIFICATION METHODS; DATA SETS; DEVELOPMENT COSTS; PRE-PROCESSING STEP; SOFTWARE DEFECT PREDICTION; SOFTWARE SYSTEMS; STATIC CODES;

CHEMICAL DETECTION; NASA; SUPPORT VECTOR MACHINES;

NEURAL NETWORKS;

EID: 78049356206     PISSN: 18650929     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-03969-0_21     Document Type: Conference Paper

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