Upgrade of the automatic analysis system in the TJ-II Thomson Scattering diagnostic: New image recognition classifier and fault condition detection

Fusion Engineering and Design

Volumn 85, Issue 3-4, 2010, Pages 415-418

  Makili, L ^a   Vega, J ^b   Dormido Canto, S ^a   Pastor, I ^b   Pereira, A ^b   Farias, G ^a   Portas, A ^b   Perez Risco D ^b   Rodriguez Fernandez M C ^b   Busch, P ^c  

^a UNIVERSIDAD NACIONAL DE EDUCACIÓN A DISTANCIA   (Spain)

^b CIEMAT   (Spain)

^c FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

Classifier; Multi class; Support vector machines; Wavelet

Indexed keywords

APPLICATION PROGRAMS; CCD CAMERAS; CLASSIFIERS; DATA ACQUISITION; ELECTRIC DISCHARGES; IMAGE RECOGNITION; LIGHT SCATTERING; STRAY LIGHT; SUPPORT VECTOR MACHINES;

ACQUISITION PROCESS; AUTOMATIC ANALYSIS; AUTOMATIC IMAGE CLASSIFICATION; MULTI-CLASS; RECOGNITION SYSTEMS; RECOVERING PROCESS; THOMSON SCATTERING DIAGNOSTICS; WAVELET;

IMAGE CLASSIFICATION;

EID: 78049342884     PISSN: 09203796     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.fusengdes.2009.10.004     Document Type: Article

References (6)

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