Regret analysis for performance metrics in multi-label classification: The case of hamming and subset zero-one loss

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6321 LNAI, Issue PART 1, 2010, Pages 280-295

  Dembczyński, Krzysztof ^a,c   Waegeman, Willem ^b   Cheng, Weiwei ^a   Hüllermeier, Eyke ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b GHENT UNIVERSITY   (Belgium)

^c POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL STUDIES; LOSS FUNCTIONS; MULTI-LABEL; MULTI-LABEL CLASSIFICATIONS; PERFORMANCE METRICS; RISK MINIMIZATION; THEORETICAL RESULT; ZERO-ONE;

CLASSIFIERS; LEARNING SYSTEMS; OPTIMIZATION;

SET THEORY;

EID: 78049326859     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-15880-3_24     Document Type: Conference Paper

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