Flash memory 'bumping' attacks

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 6225 LNCS, Issue , 2010, Pages 158-172

  Skorobogatov, Sergei ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Fault injection; Optical probing; Semi invasive attacks

Indexed keywords

AUTHENTICATION; CRYPTOGRAPHY; EMBEDDED SYSTEMS; HARDWARE SECURITY; NETWORK SECURITY; SOFTWARE TESTING;

AUTHENTICATION SCHEME; BRUTE-FORCE SEARCHING; CRYPTOGRAPHIC KEY; FAULT INJECTION; FAULT INJECTION ATTACKS; OPTICAL PROBING; SECURITY MEASURE; SEMI-INVASIVE ATTACKS;

FLASH MEMORY;

EID: 78049325204     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-15031-9_11     Document Type: Conference Paper

References (17)

1. Xilinx CoolRunner-II CPLDs in Secure Applications. White Paper, http://www.xilinx.com/support/documentation/white-papers/wp170.pdf
2. Design Security in Nonvolatile Flash and Antifuse FPGAs. Security Backgrounder, http://www.actel.com/documents/DesignSecurity-WP.pdf
3. Skorobogatov, S.: Semi-invasive attacks-A new approach to hardware security analysis. Technical Report UCAM-CL-TR-630, University of Cambridge, Computer Laboratory (April 2005), http://www.cl.cam.ac.uk/techreports/UCAM-CL- TR-630.pdf
4. Skorobogatov, S., Anderson, R.: Optical Fault Induction Attacks. In: Kaliski Jr., B. S., Koç, Ç. K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2-12. Springer, Heidelberg (2003)
5. Brown, W. D., Brewer, J. E.: Nonvolatile semiconductor memory technology: a comprehensive guide to understanding and using NVSM devices. IEEE Press, los Alamitos (1997)
6. Anderson, R. J., Kuhn, M. G.: Tamper resistance-a cautionary note. In: The Second USENIX Workshop on Electronic Commerce, Oakland, California (November 1996)
7. Wagner, L. C.: Failure Analysis of Integrated Circuits: Tools and Techniques. Kluwer Academic Publishers, Dordrecht (1999)
8. Tobias, M. W.: Opening locks by bumping in five seconds or less: is it really a threat to physical security? A technical analysis of the issues, Investigative Law Offices, http://podcasts.aolcdn.com/engadget/videos/lockdown/ bumping-040206.pdf
9. NEC PD789104A, 789114A, 789124A, 789134A Subseries User's Manual. 8-Bit Single-Chip Microcontrollers, http://www2.renesas.com/maps-download/pdf/ U13037EJ1V0PM00.pdf
10. NEC 78K/0, 78K/0S Series 8-Bit Single-Chip Microcontrollers. Flash Memory Write. Application Note, http://www.necel.com/nesdis/image/U14458EJ1V0AN00.pdf
11. Actel ProASIC3 Handbook. ProASIC3 Flash Family FPGAs, http://www.actel.com/documents/PA3-HB.pdf
12. Actel: ISP and STAPL. Application Note AC171, http://www.actel.com/ documents/ISP-STAPL-AN.pdf
13. Kocher, P., Jaffe, J., Jun, B.: Differential Power Analysis. In: Wiener, M. (ed.) CRYPTO 1999. LNCS, vol. 1666, pp. 388-397. Springer, Heidelberg (1999)
14. Ajluni, C.: Two new imaging techniques promise to improve IC defect identification. Electronic Design 43(14), 37-38 (1995)
15. Giraud, C.: DFA on AES. In: Dobbertin, H., Rijmen, V., Sowa, A. (eds.) AES 2004. LNCS, vol. 3373, pp. 27-41. Springer, Heidelberg (2005)
16. Actel ProASIC3/E Production FPGAs. Features and Advantages, http://www.actel.com/documents/PA3-E-Tech-WP.pdf
17. Skorobogatov, S.: Using Optical Emission Analysis for Estimating Contribution to Power Analysis. In: 6th Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC 2009), Lausanne, Switzerland, September 2009, pp. 111-119. IEEE-CS Press, los Alamitos (2009) ISBN 978-0-7695-3824-2