Impact of network topology on cationic diffusion and hardness of borate glass surfaces

Journal of Chemical Physics

Volumn 133, Issue 15, 2010, Pages

  Smedskjaer, Morten M ^a   Mauro, John C ^b   Sen, Sabyasachi ^c   Deubener, Joachim ^d   Yue, Yuanzheng ^a,e  

^a AALBORG UNIVERSITY   (Denmark)

^b Corning Incorporated ^*  (United States)

^c University of California   (United States)

^d CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^e QILU UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PACKING; BORATE GLASS; BORON ANOMALY; BULK GLASS; ELECTROSTATIC ENVIRONMENTS; GLASS SURFACES; INWARD DIFFUSION; MODIFIED SURFACES; NETWORK TOPOLOGY; NON-BRIDGING OXYGEN; QUANTITATIVE PREDICTION; SODA LIME; SURFACE TOPOLOGY; TEMPERATURE DEPENDENT; TOPOLOGICAL CONSTRAINTS; TOPOLOGICAL FEATURES;

BORON; BORON COMPOUNDS; CONSTRAINT THEORY; DIFFUSION; ELECTRIC NETWORK TOPOLOGY; GLASS; HARDNESS; MECHANICAL PROPERTIES; OXYGEN; TRANSPORT PROPERTIES;

SURFACE PROPERTIES;

EID: 78049263005     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3497036     Document Type: Article

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