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Volumn 405, Issue 23, 2010, Pages 4772-4775
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Dielectric and piezoelectric properties of SrBi4-xHo xTi4O15 (x=0.00, 0.02, 0.04 and 0.06) ceramics
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Author keywords
Bismuth layered structures; Dielectric properties; Ferroelectrics; High temperature piezoelectric
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Indexed keywords
DIELECTRIC AND PIEZOELECTRIC PROPERTIES;
DIFFERENT FREQUENCY;
FERROELECTRICS;
HIGH TEMPERATURE PIEZOELECTRIC;
LAYERED PEROVSKITE;
LAYERED STRUCTURES;
PIEZOELECTRIC PROPERTY;
SINGLE PHASE;
STATE REACTION;
X-RAY DIFFRACTION MEASUREMENTS;
BISMUTH;
CERAMIC MATERIALS;
HOLMIUM;
PEROVSKITE;
SINTERING;
SOLID STATE REACTIONS;
X RAY DIFFRACTION;
PIEZOELECTRICITY;
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EID: 78049257253
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2010.08.074 Document Type: Article |
Times cited : (31)
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References (22)
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