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Volumn 32, Issue 1, 2011, Pages 3-11

Structural matching of 2D electrophoresis gels using deformed graphs

Author keywords

Deformed graphs; Electrophoresis gels; Graph matching; Maximum common subgraph; Point matching; Structural pattern recognition

Indexed keywords

COMMON SUBGRAPH; DEFORMED GRAPHS; ELECTROPHORESIS GELS; GRAPH MATCHINGS; POINT-MATCHING; STRUCTURAL PATTERN RECOGNITION;

EID: 78049244985     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2010.02.016     Document Type: Conference Paper
Times cited : (19)

References (14)
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    • Barrow, H.G.1    Popplestone, R.J.2
  • 5
    • 0031198630 scopus 로고    scopus 로고
    • On a relation between graph edit distance and maximum common subgraph
    • H. Bunke On a relation between graph edit distance and maximum common subgraph Pattern Recognition Lett. 18 9 1997 689 694
    • (1997) Pattern Recognition Lett. , vol.18 , Issue.9 , pp. 689-694
    • Bunke, H.1
  • 7
    • 24044527129 scopus 로고    scopus 로고
    • Inexact graph matching for model-based recognition: Evaluation and comparison of optimization algorithms
    • R.M. Cesar Jr., E. Bengoetxea, I. Bloch, and P. Larrañaga Inexact graph matching for model-based recognition: Evaluation and comparison of optimization algorithms Pattern Recognition 38 11 2005 2099 2113
    • (2005) Pattern Recognition , vol.38 , Issue.11 , pp. 2099-2113
    • Cesar Jr., R.M.1    Bengoetxea, E.2    Bloch, I.3    Larrañaga, P.4
  • 13
    • 33947244929 scopus 로고    scopus 로고
    • Robust and accurate registration of 2-D electrophoresis gels using point matching
    • M. Rogers, and M. Graham Robust and accurate registration of 2-D electrophoresis gels using point matching IEEE Trans. Image Proc. 16 3 2007 624 635
    • (2007) IEEE Trans. Image Proc. , vol.16 , Issue.3 , pp. 624-635
    • Rogers, M.1    Graham, M.2
  • 14
    • 0018732476 scopus 로고
    • Error-correcting isomorphisms of attributed relational graphs for pattern analysis
    • W.H. Tsai, and K.S. Fu Error-correcting isomorphisms of attributed relational graphs for pattern analysis IEEE Trans. Systems Man Cybernet. 9 12 1979 757 768
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    • Tsai, W.H.1    Fu, K.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.