Trapped-ion probing of light-induced charging effects on dielectrics

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Harlander, M ^a   Brownnutt, M ^a   Hansel W ^a,b   Blatt, R ^a,b  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION; CHARGING EFFECT; ELECTRODE MATERIAL; ELEMENTARY CHARGE; ION TRAPS; OPTICAL POWER; TRAPPING POTENTIAL;

DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTROCHEMICAL ELECTRODES; ELECTROMAGNETIC INDUCTION; LIGHT;

IONS;

EID: 77958608374     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/9/093035     Document Type: Article

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