Shallow impurity absorption spectroscopy in isotopically enriched silicon

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 231-232

  Steger, M ^a   Yang, A ^a   Karaiskaj, D ^a   Thewalt, M L W ^a   Haller, E E ^b   Ager III, J W ^b   Cardona, M ^c   Riemann, H ^d   Abrosimov, N V ^d   Gusev, A V ^e   Bulanov, A D ^e   Kaliteevskii, A K ^f   Godisov, O N ^f   Becker, P ^g   Pohl, H J ^h   Itoh, K M ⁱ  

^a SIMON FRASER UNIVERSITY   (Canada)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^d LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^e INSTITUTE OF CHEMISTRY OF HIGH PURITY SUBSTANCES   (Russian Federation)

^f Science and Technical Center Centrotech   (Russian Federation)

^g PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^h VITCON Projectconsult GmbH   (Germany)

ⁱ KEIO UNIVERSITY   (Japan)

Author keywords

Infrared absorption; Isotopically enriched silicon; Shallow impurities

Indexed keywords

EID: 77958559096     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2729853     Document Type: Conference Paper

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