Effect of water and air-water interface on the structural modification of Ni-arachidate Langmuir-Blodgett films

Journal of Colloid and Interface Science

Volumn 353, Issue 1, 2011, Pages 316-321

  Kundu, Sarathi ^a   Raychaudhuri, A K ^a  

^a S N BOSE NATIONAL CENTRE FOR BASIC SCIENCES   (India)

Author keywords

AFM; Interface; Langmuir monolayer; LB films; Morphology; Nickel arachidate; Out of plane structure; Subphase effect; Surface modification; X ray reflectivity

Indexed keywords

AFM; INTERFACE; LANGMUIR MONOLAYERS; LB FILMS; OUT-OF-PLANE; SUBPHASES; SURFACE MODIFICATION; X RAY REFLECTIVITY;

AIR; ATOMIC FORCE MICROSCOPY; CADMIUM; HYDROPHOBICITY; MONOLAYERS; MORPHOLOGY; NICKEL; PHASE INTERFACES; REFLECTION; X RAYS;

LANGMUIR BLODGETT FILMS;

ARACHIDIC ACID; CADMIUM; NICKEL; NICKEL ARACHIDATE; SILICON; UNCLASSIFIED DRUG; WATER;

AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; CONTROLLED STUDY; HYDROPHILICITY; HYDROPHOBICITY; LANGMUIR BLODGETT FILM; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; PHASE TRANSITION; PRIORITY JOURNAL; STRUCTURE ANALYSIS; SURFACE PROPERTY; X RAY ANALYSIS;

EID: 77958478625     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.09.048     Document Type: Article

References (25)

1. Petty M.C. Langmuir-Blodgett Films: An Introduction 1996, Cambridge University Press, New York.
2. Schwartz D.K. Surf. Sci. Rep. 1997, 27:245.
3. Gibaud A., Cowlam N., Vignaud G., Richardson T. Phys. Rev. Lett. 1995, 74:3205.
4. Basu J.K., Sanyal M.K. Phys. Rep. 2002, 363:1.
5. Singhal R., Chaubey A., Kaneto K., Takashima W., Malhotra B.D. Biotechnol. Bioeng. 2004, 85:277.
6. Tollner K., Popovitz-Biro R., Lahav M., Milstein D. Science 1997, 278:2100.
7. Hosoki K., Tayagaki T., Yamamoto S., Matsuda K., Kanemitsu Y. Phys. Rev. Lett. 2008, 100:207404.
8. Brar L.K., Rajdev P., Raychaudhuri A.K., Chatterji D. Langmuir 2005, 21:10671.
9. Kashlev M., Martin E., Polyakov A., Severinov K., Nikiforov V., Goldfarb A. Gene 1993, 130:9.
10. Geue Th., Schultz M., Englisch U., Stömmer R., Pietsch U., Meine K., Vollhardt D. J. Chem. Phys. 1999, 110:8104.
11. Zasadzinski J.A., Viswanathan R., Madsen L., Garnaes J., Schwartz D.K. Science 1994, 263:1726.
12. Bal J.K., Hazra S.KunduS. Phys. Rev. B 2010, 84:045404.
13. Kondrashina E.A., Hagedorn K., Vollhardt D., Schmidbauer M., Köhler R. Langmuir 1996, 12:5148.
14. Takamoto D.Y., Aydil E., Zasadzinski J.A., Ivanova A.T., Schwartz D.K., Yang T., Cremer P.S. Science 2001, 293:1292.
15. Kundu S., Datta A., Hazra S. Chem. Phys. Lett. 2005, 405:282.
16. Okahata Y., Ariga K. Thin Solid Films 1989, 178:465.
17. Okahata Y., Ariga K. Langmuir 1989, 5:1261.
18. Schwartz D.K., Viswanathan R., Zasadzinski J.A. J. Phys. Chem. 1992, 96:10444.
19. Schwartz D.K., Garnaes J., Viswanathan R., Chiruvolu S., Zasadzinski J.A. Phys. Rev. E 1993, 47:452.
20. Parratt L.G. Phys. Rev. 1954, 95:359.
21. Daillant J., Gibaud A. X-Ray and Neutron Reflectivity: Principles and Applications 1999, Springer, Berlin.
22. Kundu S., Datta A., Hazra S. Phys. Rev. E 2006, 73:051608.
23. Schwartz D.K., Garnaes J., Viswanathan R., Zasadzinski J.A. Science 1992, 257:508.
24. Irving H., Williams R.J.P. J. Chem. Soc. 1953, 3192.
25. Israelachvili J. Intermolecular & Surface Forces 1985, Academic Press, New York.