Measurement of deep intrinsic defects in thin ZnO films via mid-infrared photocurrent spectroscopy

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 301-302

  Frenzel, H ^a   Wenckstern, H V ^a   Weber, A ^a   Biehne, G ^a   Hochmuth, H ^a   Lorenz, M ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Deep level transient spectroscopy; Defects; FTIR; Photocurrent; Schottky contact; ZnO

Indexed keywords

EID: 77958466145     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2729887     Document Type: Conference Paper

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