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Volumn 97, Issue 16, 2010, Pages

Band offsets determination and interfacial chemical properties of the Al2 O3 /GaSb system

Author keywords

[No Author keywords available]

Indexed keywords

BAND OFFSETS; CAPACITANCE VOLTAGE MEASUREMENTS; HCL SOLUTION; INTERFACIAL CHEMICALS; OXIDE FORMATION; SURFACE PASSIVATION; VALENCE BAND OFFSETS;

EID: 77958462866     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499655     Document Type: Article
Times cited : (31)

References (14)
  • 4
    • 33746281113 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.2213170
    • J. Robertson and B. Falabretti, J. Appl. Phys. 0021-8979 100, 014111 (2006). 10.1063/1.2213170
    • (2006) J. Appl. Phys. , vol.100 , pp. 014111
    • Robertson, J.1    Falabretti, B.2
  • 11
    • 0037042072 scopus 로고    scopus 로고
    • 0169-4332,. 10.1016/S0169-4332(01)00841-8
    • S. Miyazaki, Appl. Surf. Sci. 0169-4332 190, 66 (2002). 10.1016/S0169-4332(01)00841-8
    • (2002) Appl. Surf. Sci. , vol.190 , pp. 66
    • Miyazaki, S.1
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.