Interface effects on an ultrathin Co film in multilayers based on the organic semiconductor Alq3

Applied Physics Letters

Volumn 97, Issue 16, 2010, Pages

  Sidorenko, A A ^a,e   Pernechele, C ^a   Lupo, P ^a   Ghidini, M ^a   Solzi, M ^a   De Renzi, R ^a   Bergenti, I ^b   Graziosi, P ^b   Dediu, V ^b   Hueso, L ^c   Hindmarch, A T ^d  

^a UNIVERSITY OF PARMA   (Italy)

^b CNR   (Italy)

^c BASQUE FOUNDATION FOR SCIENCE   (Spain)

^d UNIVERSITY OF LEEDS   (United Kingdom)

^e VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER THICKNESS; COBALT LAYERS; HYBRID STRUCTURE; INTERFACE EFFECT; INTERFACE LAYER; MORPHOLOGICAL PROPERTIES; NMR MEASUREMENTS; ORGANIC SEMICONDUCTOR; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRY; ULTRATHIN CO FILMS;

ATOMIC FORCE MICROSCOPY; COBALT; CRYSTAL ATOMIC STRUCTURE; MAGNETIC PROPERTIES; RESONANCE; SEMICONDUCTOR GROWTH; SQUIDS; SUPERCONDUCTING MAGNETS;

NUCLEAR MAGNETIC RESONANCE;

EID: 77958457201     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3505495     Document Type: Article

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