Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand

Journal of Applied Physics

Volumn 108, Issue 7, 2010, Pages

  Kane, D M ^a   Naidoo, N ^a   Staib, G R ^a,b  

^a MACQUARIE UNIVERSITY   (Australia)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; GEOMETRIC DISTORTION; MICRO-SCALES; NANO SCALE; OPTICAL SURFACES; SAMPLE PREPARATION; SILK FIBER; SPIDER SILKS; SURFACE FEATURE; SURFACE NANOSTRUCTURING; SURFACE TOPOLOGY;

ATOMIC FORCE MICROSCOPY; SURFACE ROUGHNESS; TOPOLOGY;

SILK;

EID: 77958179053     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3490220     Document Type: Article

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