Polarization relaxation mechanism of Ba0.6Sr 0.4TiO3/Ni0.8Zn0.2Fe 2O4 composite with giant dielectric constant and high permeability

Journal of Applied Physics

Volumn 108, Issue 7, 2010, Pages

  Yang, Haibo ^a,b   Wang, Hong ^a   He, Li ^a   Shui, Li ^a   Yao, Xi ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC AND MAGNETIC PROPERTIES; DIELECTRIC BEHAVIOR; DIELECTRIC CONSTANTS; GIANT DIELECTRIC CONSTANTS; HIGH PERMEABILITY; LOW FREQUENCY RANGE; MAXWELL-WAGNER POLARIZATION; POLARIZATION RELAXATION; SCANNING ELECTRON MICROSCOPE; SOLID STATE REACTION METHOD; TIO; X RAY DIFFRACTOMETRY;

BARIUM; MAGNETIC PROPERTIES; PERMITTIVITY; POLARIZATION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC;

DIELECTRIC MATERIALS;

EID: 77958163812     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3490782     Document Type: Article

References (34)

1. H. B. Yang, H. Wang, F. Xiang, and X. Yao, J. Am. Ceram. Soc. JACTAW 0002-7820 92, 2005 (2009). 10.1111/j.1551-2916.2009.03149.x
2. H. B. Yang, H. Wang, F. Xiang, and X. Yao, J. Electroceram. JOELFJ 1385-3449 22, 221 (2009). 10.1007/s10832-007-9368-z
3. K. S. Deepa, M. T. Sebastian, and J. James, Appl. Phys. Lett. APPLAB 0003-6951 91, 202904 (2007). 10.1063/1.2807271 (Pubitemid 350128927)
4. A. Testino, L. Mitoseriu, V. Buscaglia, M. T. Buscaglia, I. Pallecchi, A. S. Albuquerque, V. Calzona, D. Marre, A. S. Siri, and P. Nanni, J. Eur. Ceram. Soc. JECSER 0955-2219 26, 3031 (2006). 10.1016/j.jeurceramsoc.2006.02.022 (Pubitemid 44164186)
5. C. W. Nan, M. I. Bichurin, S. X. Dong, D. Viehland, and G. Srinivasan, J. Appl. Phys. JAPIAU 0021-8979 103, 031101 (2008). 10.1063/1.2836410 (Pubitemid 351263897)
6. A. R. Iordan, M. Airimioaiei, M. N. Palamaru, C. Galassi, A. V. Sandu, C. E. Ciomaga, F. Prihor, L. Mitoseriu, and A. Ianculescu, J. Eur. Ceram. Soc. JECSER 0955-2219 29, 2807 (2009). 10.1016/j.jeurceramsoc.2009.03.031
7. B. K. Bammannavar and L. R. Naik, Smart Mater. Struct. SMSTER 0964-1726 18, 085013 (2009). 10.1088/0964-1726/18/8/085013
8. M. V. Ramanaa, N. R. Reddy, G. Sreenivasulu, K. V. Siva kumar, B. S. Murty, and V. R. K. Murthy, Curr. Appl. Phys. ZZZZZZ 1567-1739 9, 1134 (2009). 10.1016/j.cap.2009.01.002
9. H. F. Zhang, S. W. Or, and H. L. W. Chan, J. Appl. Phys. JAPIAU 0021-8979 104, 104109 (2008). 10.1063/1.3021349
10. Y. J. Li, X. M. Chen, R. Z. Hou, and Y. H. Tang, Solid State Commun. SSCOA4 0038-1098 137, 120 (2006).
11. Z. Yu and C. Ang, J. Appl. Phys. JAPIAU 0021-8979 91, 794 (2002). 10.1063/1.1421033 (Pubitemid 34091036)
12. Y. Q. Lin and X. M. Chen, Mater. Chem. Phys. MCHPDR 0254-0584 117, 125 (2009). 10.1016/j.matchemphys.2009.05.022
13. T. B. Adams, D. C. Sinclair, and A. R. West, Adv. Mater. ADVMEW 0935-9648 14, 1321 (2002). 10.1002/1521-4095(20020916)14:18<1321::AID-ADMA13213.0. CO;2-P
14. P. Lunkenheimer, R. Fichtl, S. G. Ebbinghaus, and A. Loidl, Phys. Rev. B PLRBAQ 0556-2805 70, 172102 (2004). 10.1103/PhysRevB.70.172102 (Pubitemid 40116095)
15. L. Ni and X. M. Chen, Appl. Phys. Lett. APPLAB 0003-6951 91, 122905 (2007). 10.1063/1.2785128 (Pubitemid 47469584)
16. I. P. Raevski, S. A. Prosandeev, A. S. Bogatin, M. A. Malitskaya, and L. Jastrabik, J. Appl. Phys. JAPIAU 0021-8979 93, 4130 (2003). 10.1063/1.1558205
17. Z. Wang, X. M. Chen, L. Ni, and X. Q. Liu, Appl. Phys. Lett. APPLAB 0003-6951 90, 022904 (2007). 10.1063/1.2430939 (Pubitemid 46105591)
18. J. B. Wu, C. W. Nan, Y. H. Lin, and Y. Deng, Phys. Rev. Lett. PRLTAO 0031-9007 89, 217601 (2002). 10.1103/PhysRevLett.89.217601
19. Y. H. Lin, M. Li, C. W. Nan, J. F. Li, J. B. Wu, and J. L. He, Appl. Phys. Lett. APPLAB 0003-6951 89, 032907 (2006). 10.1063/1.2227636 (Pubitemid 44107080)
20. P. Thongbai, T. Yamwong, and S. Maensiri, Appl. Phys. Lett. APPLAB 0003-6951 94, 152905 (2009). 10.1063/1.3120567
21. G. Catalan, D. O'neill, R. M. Bowman, and J. M. Gregg, Appl. Phys. Lett. APPLAB 0003-6951 77, 3078 (2000). 10.1063/1.1324729
22. C. Pecharromán, F. Esteban-Betegon, J. F. Bartolome, S. Lopez-Esteban, and J. S. Moya, Adv. Mater. ADVMEW 0935-9648 13, 1541 (2001). 10.1002/1521-4095(200110)13: 20<1541::AID-ADMA15413.0.CO;2-X
23. W. W. Cho, I. Kagomiya, K. Kakimoto, and H. Ohsato, Appl. Phys. Lett. APPLAB 0003-6951 89, 152905 (2006). 10.1063/1.2361176 (Pubitemid 44570584)
24. P. Q. Mantas, J. Eur. Ceram. Soc. JECSER 0955-2219 19, 2079 (1999). 10.1016/S0955-2219(98)00273-8
25. J. J. Liu, C. G. Duan, W. G. Yin, W. N. Mei, R. W. Smith, and J. R. Hardy, Phys. Rev. B PLRBAQ 0556-2805 70, 144106 (2004). 10.1103/PhysRevB.70. 144106 (Pubitemid 40052567)
26. L. Y. Zhang and X. Yao, Dielectric Physics (Chinese) (Xi'an Jiaotong University Press, Xi'an, 1991), p. 175.
27. M. M. Haque, M. Huq, and M. A. Hakim, Mater. Chem. Phys. MCHPDR 0254-0584 112, 580 (2008). 10.1016/j.matchemphys.2008.05.097
28. C. C. Wang, Y. M. Cui, and L. W. Zhang, Appl. Phys. Lett. APPLAB 0003-6951 90, 012904 (2007). 10.1063/1.2430634 (Pubitemid 46068347)
29. L. Y. Zhang and X. Yao, Dielectric Physics (Chinese) (Xi'an Jiaotong University Press, Xi'an, 1991), p. 134.
30. S. Pongha, P. Thongbai, T. Yamwong, and S. Maensiri, Scr. Mater. SCMAF7 1359-6462 60, 870 (2009). 10.1016/j.scriptamat.2009.01.037
31. H. Rikukawa, IEEE Trans. Magn. IEMGAQ 0018-9464 18, 1535 (1982). 10.1109/TMAG.1982.1062065
32. J. L. Snoek, Physica (Amsterdam) PHYSAG 0031-8914 14, 207 (1948). 10.1016/0031-8914(48)90038-X
33. B. W. Li, Y. Shen, Z. X. Yue, and C. W. Nan, J. Appl. Phys. JAPIAU 0021-8979 99, 123909 (2006). 10.1063/1.2206704 (Pubitemid 44000426)
34. H. Waki, H. Igarashi, and T. Honma, IEEE Trans. Magn. IEMGAQ 0018-9464 41, 1520 (2005). 10.1109/TMAG.2005.845071 (Pubitemid 40963519)