A biased anode to suppress ion back- bombardment in a DC high voltage photoelectron gun

AIP Conference Proceedings

Volumn 980, Issue , 2008, Pages 110-117

  Grames, J ^a   Adderley, P ^a   Brittian, J ^a   Clark, J ^a   Hansknecht, J ^a   MacHie, D ^a   Poelker, M ^a   Pozdeyer, E ^b   Stutzma, M ^a   Surles Law, K ^a  

^a Jefferson National Accelerator Facility   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Electron source; Photocathode

Indexed keywords

EID: 77958156345     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2888075     Document Type: Conference Paper

References (12)

1. C. K. Sinclair et al., Phys. Rev. Special Topics Accelerator and Beams 10, 023501 (2007).
2. I. Bazarov et al., in Proc. of the 2002 European Particle Accelerator Conference, Paris, France.
3. I. Ben-Zvi et al., in Proceedings of the 2007 Particle Accelerator Conference, WEOCKI03, p. 1938.
4. S. Golge et al., in Proceedings of the 2007 Particle Accelerator Conference, THPMS067, p. 3133.
5. K. Aulenbacher et al., SLAC Report 432 (1993).
6. M, Reiser, Theory and Design of Charged Particle Beams, John Wiley & Sons, Inc. (1994).
7. E. Pozdeyev, Phys. Rev. ST-AB 85, p. 2503-2504 (2007).
8. J. Grames et al., in AIP Conference Proceedings 915, p. 1037-1044 (2006).
9. J. Grames et al., in Proceedings of the 2007 Particle Accelerator Conference, THPMS064, p. 3130.
10. K. Halbach and R. Holsinger, Particle Accelerators 7, 21 (1976); see http://laacgl.lanl.gov/.
11. Note the electrostatic center does not always correspond to the geometric center of the photocathode active area. Small misalignment may result due to assembly misalignment of the cathode/anode electrodes and location of the activation mask used to limit the active area of the photocathode.
12. J. Grames et al., work to be published.