Roundtable: Reliability of embedded and cyber-physical systems

IEEE Security and Privacy

Volumn 8, Issue 5, 2010, Pages 27-32

  Barnum, Sean ^a   Sastry, Shankar ^b   Stankovic, John A ^c  

^a MITRE CORPORATION   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF VIRGINIA   (United States)

Author keywords

cyberphysical systems; embedded systems; healthcare; reliability; smart grid

Indexed keywords

CYBER-PHYSICAL SYSTEMS; SMART GRID; UNIVERSITY OF VIRGINIA;

RELIABILITY;

EMBEDDED SYSTEMS;

EID: 77958143606     PISSN: 15407993     EISSN: None     Source Type: Journal    
DOI: 10.1109/MSP.2010.162     Document Type: Review

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