Imagery spatial performance throughput correction methodology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7813, Issue , 2010, Pages

  Fang, Daniel T ^a   Puschell, Jeff ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

Angular sample interval; Integration and test; Irradiance uniformity; Line spread function; Reticle; Spatial performance; Special test equipment; Through focus measurement

Indexed keywords

ANGULAR SAMPLE INTERVAL; FOCUS MEASUREMENT; IRRADIANCE UNIFORMITY; LINE SPREAD FUNCTIONS; RETICLE; SPATIAL PERFORMANCE; SPECIAL TEST EQUIPMENTS;

EQUIPMENT; INTEGRATION; LIGHT SOURCES; OPTICAL INSTRUMENTS; REMOTE SENSING; SPHERES; SYSTEMS ENGINEERING; TEST FACILITIES; THROUGHPUT;

TESTING;

EID: 77958135954     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.860740     Document Type: Conference Paper

References (2)

1. Xiong, X., Chiang, K., Esposito, J., Guenther, B., and Barnes, W. L., 2003, "MODIS On-Orbit Calibration and Characterization," Metrologia 40, 89-92.
2. Xiong, X., Che, N., and Barnes, W. L., 2005, "Terra MODIS on-orbit spatial characterization and performance," IEEE Trans. Geo and Remote Sens., Vol. 43, 355-365.