Application of wavelet transform in laser-induced breakdown spectra compression

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 30, Issue 10, 2010, Pages 2797-2801

  Jiang, Mei Cheng ^a   Lu, Ji Dong ^a   Yao, Shun Chun ^a   Pan, Sheng Hua ^a   Chen, Kai ^a   Dong, Mei Rong ^a  

^a SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Coal; Compress; Laser induced breakdown spectrum; Wavelet transform

Indexed keywords

COAL SAMPLE; COMPRESS; COMPRESSION PERFORMANCE; COMPRESSION SCHEME; DB WAVELET; LASER INDUCED BREAKDOWN; LASER-INDUCED BREAKDOWN SPECTRUM; MAIN CHARACTERISTICS; MAIN PARAMETERS; PARAMETER SELECTION; RELATIVE DEVIATIONS; SPECTRAL DATA; SPECTRAL LINE; STORAGE SPACES; THRESHOLD METHODS;

COAL; COAL INDUSTRY; METADATA; SPECTROSCOPY;

WAVELET TRANSFORMS;

EID: 77958102241     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: 10.3964/j.issn.1000-0593(2010)10-2797-05     Document Type: Article

References (12)

1. Gaft M, Sapir-Sofer I, Modiano H, et al. Spectrochimica Acta Part B, 2007, 62(12): 1496.
2. Gaft M, Dvir E, Modiano H, et al. Spectrochimica Acta Part B, 2008, 63(10): 1177.
3. Harrington P B, Isenhour T L. Appl. Spectrosc., 1987, 41(3): 449.
4. Owens P M, Isenhour T L. Anal. Chem., 1983, 55: 1548.
5. Xiong Zhi-Xin. Chemograms Date Processing Through Wavelet Transform. Hangzhou: Zhejiang University Press, 2004.
6. Chau F T, Gao J B, Shin T M, et al. Appl. Spectrosc., 1997, 51(5): 649.
7. Li Meng-Long, Kang Bin, Qi Hua-Yi, et al. Chem. J. Chinese Universities, 2002, 23(7): 1281.
8. Han Ying-Zhe, Zhang Yan, Chang Sheng-Jiang, et al. Journal of Optoelectronics-Laser, 2005, 16(6): 718.
9. Dong Chang-Hong. The Theory and Application of Matlab Wavelet Toolbox. Bgeijing: National Defense Industry Press, 2004. 130.
10. Yang Jian-Guo. Wavelet Analysis and Its Engineering Application. Beijing: China Machine Press, 2005. 104.
11. Li Meng-Long, Kang Bin, Qi Hua-Yi, et al. Chemistry Bulletin, 2002, 65, w71.
12. Yao Shun-Chun, Lu Ji-Dong, Pan Sheng-Hua, et al. Proceeding of the Chinese Society for Electrical Engineering, 2009, 29(23): 80.