Automatic coefficient selection in Weighted Maximum Margin Criterion

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2008, Pages

  Cheng, Zhengdong ^a,b   Shen, Bin ^a   Fan, Xiang ^b,c   Zhang, Yu Jin ^a  

^a TSINGHUA UNIVERSITY   (China)

^b ELECTRONIC ENGINEERING INSTITUTE   (China)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FACE DATABASE; LINEAR DISCRIMINANT ANALYSIS; WEIGHTED MAXIMUM MARGIN CRITERIONS;

DISCRIMINANT ANALYSIS; OPTIMIZATION; PATTERN RECOGNITION;

PROBLEM SOLVING;

EID: 77958084225     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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