Breakdown strength of solid|solid interface

Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

Volumn , Issue , 2010, Pages

  Hasheminezhad, Seyed Majid ^a   Ildstad, Erling ^a   Nysveen, Arne ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN STRENGTHS; ELECTRICAL INSULATION SYSTEMS; ELECTRICAL STRESS; EXPERIMENTAL OBSERVATION; GAS PRESSURES; INTERFACE PRESSURE; INTERFACIAL PRESSURE; LIQUID DIELECTRICS; MECHANICAL CONTACT; SOLID INTERFACES; VOID SIZE;

DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF LIQUIDS; ELECTRIC BREAKDOWN; PRESSURE EFFECTS; SURFACE ROUGHNESS;

PHASE INTERFACES;

EID: 77958073888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSD.2010.5568229     Document Type: Conference Paper

References (5)

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